SUBJECT
Title
Microanalytical Mesurement Techniques
Type of instruction
lecture
Level
Master
Faculty
Part of degree program
Credits
2
Recommended in
Semesters 3-4
Typically offered in
Autumn/Spring semester
Course description
Fundamentals of emission and absorption spectra of atoms, atom and ion sources used in microanalysis, characteristics of X-ray fluorescence, total-reflection and its consequences, detection of ions from an ICP by mass spectrometry. Scanning electron microscopy, specimen preparation, coating procedures, interpretation of X-ray micrographs, elemental mapping. Comparison of analytical features of selected methods.
Readings
-
Klockenkamper R.: Fundamentals of TXRF analysis Wiley-Elsevier 1996.
-
Newbury D.E., Joy D.C., Echlin P., Fiori C.E., Goldstein J.I.: Advanced Scanning Electron Microscopy and X-Ray Microanalysis, Springer 1986