SUBJECT
Title
Electron optical methods in geology
Type of instruction
lecture
Level
master
Faculty
Part of degree program
Credits
2
Recommended in
Semester 3
Typically offered in
Autumn semester
Course description
Modern-day electron-beam instruments for the analyses of solid materials are presented, which are available in a variety of forms with wide range of capabilities. The two basic types of electron-beam instruments currently available are the scanning electron microscope (SEM) and the transmission electron microscope (TEM), these are discussed in detail. The optimization of specific electron-beam instruments target certain applications.
Readings
Mackinnon, I.D.R. & Mumpton, F.A. (1990): Electron-Optical Methods in Clay Science. Clay Minerals Society Workshop Lectures Volume 2, 169 p.